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The modular small-angle X-ray scattering data correction sequence

B R Pauw1, A J Smith2, T Snow2

  • 1Bundesanstalt für Materialforschung und -prüfung (BAM), 12205 Berlin, Germany.

Journal of Applied Crystallography
|December 9, 2017
PubMed

Keywords:
accuracydata correctionmethodologysmall-angle scattering

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