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Published on: May 13, 2020
Remote control of resistive switching in TiO2 based resistive random access memory device
Dwipak Prasad Sahu1, S Narayana Jammalamadaka2
1Magnetic Materials and Device Physics Laboratory, Department of Physics, Indian Institute of Technology Hyderabad, Hyderabad, 502 285, India.
This study demonstrates magnetic field control of resistive switching in Ag/TiO2/FTO memory devices. The Lorentz force influences resistance states, enabling reproducible, reversible, and remotely controllable multi-bit data storage.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Electrical Engineering
Background:
- Resistive random access memory (RRAM) devices offer promising solutions for next-generation data storage.
- Controlling the resistive switching behavior of RRAM devices is crucial for enhancing their performance and functionality.
- External stimuli, such as magnetic fields, present an avenue for novel control mechanisms in RRAM.
Purpose of the Study:
- To investigate the magnetic field control of bipolar resistive switching in an Ag/TiO2/FTO based RRAM device.
- To elucidate the role of the Lorentz force in modulating the device's resistance states.
- To assess the endurance and controllability of the device under magnetic field influence for potential multi-bit data storage applications.
Main Methods:
- Fabrication of Ag/TiO2/FTO based RRAM devices.
- Characterization of device performance using current-voltage (I-V) measurements.
- Analysis of device behavior under varying magnetic field conditions.
- Evaluation of endurance characteristics through repeated switching cycles.
Main Results:
- Demonstrated magnetic field control over bipolar resistive switching in the Ag/TiO2/FTO device.
- Observed an abrupt resistance change requiring higher voltage in the low resistance state under magnetic field, attributed to the Lorentz force.
- Confirmed reproducible, reversible, and controllable switching between 'on' and 'off' states with no degradation after repeated cycling.
- Showcased magnetic field influence on 'on' and 'off' states during endurance testing.
Conclusions:
- The Lorentz force significantly influences the resistance state of the Ag/TiO2/FTO RRAM device.
- The device exhibits robust endurance and reliable switching, making it suitable for practical applications.
- Remote magnetic field control of resistive switching opens possibilities for advanced multi-bit data storage solutions.
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