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This study analyzes F-type color center annealing in irradiated ionic materials. Defect migration energy decreases with radiation fluence, following the Meyer-Neldel rule.

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Area of Science:

  • Materials Science
  • Solid State Physics
  • Radiation Damage

Background:

  • F-type color centers, such as oxygen vacancies with trapped electrons, are crucial defects in ionic materials.
  • Understanding their annealing kinetics is vital for predicting material behavior under irradiation.

Purpose of the Study:

  • To analyze the annealing kinetics of F-type color centers in Al2O3, MgO, and MgF2.
  • To extract migration energies and diffusion pre-exponential factors of interstitial ions.
  • To investigate the influence of radiation fluence on defect migration parameters.

Main Methods:

  • Experimental analysis of annealing kinetics for irradiated ionic materials (Al2O3, MgO, MgF2).
  • Application of phenomenological theory for diffusion-controlled recombination.
  • Comparison of experimental data with first-principles calculations.

Main Results:

  • Migration energy and pre-exponential factor of interstitials decrease with increasing radiation fluence.
  • This correlation follows the Meyer-Neldel rule, observed in various disordered materials.
  • The effect is independent of the irradiation type (electrons, neutrons, heavy ions).

Conclusions:

  • The dependence of defect migration parameters on radiation fluence is significant and cannot be ignored in radiation damage analysis.
  • The observed Meyer-Neldel rule provides insights into the origin of this fluence dependence.
  • This research highlights the importance of considering dynamic defect properties in irradiated materials.