Transmission scanning electron microscopy: Defect observations and image simulations

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Patrick G Callahan1, Jean-Charles Stinville1, Eric R Yao1

  • 1Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA.

Ultramicroscopy
|December 22, 2017
PubMed

Keywords:
STEM

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