Real-time scan speed control of the atomic force microscopy for reducing imaging time based on sample topography

Area of Science:

• Materials Science
• Nanotechnology
• Surface Science

Background:

• Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
• Current AFM imaging rates are often limited by fixed scan speeds.
• Increasing imaging speed without compromising resolution is a persistent challenge.

Purpose of the Study:

• To introduce a novel real-time scan speed control method for amplitude modulation AFM (AM-AFM).
• To enhance the imaging rate of AM-AFMs, particularly for samples with complex topography.
• To reduce the technical expertise needed for operating AM-AFMs.

Main Methods:

• Developed a real-time control algorithm that adjusts scan speed linearly based on imaging point error.
• Implemented a system to optimize residence time at each imaging point.
• Validated the method through experimental and simulation studies.

Main Results:

• Achieved up to a 3-fold increase in imaging rate for samples with significant topographic variations.
• Maintained high image quality, especially for large-scale and high-resolution scans.
• Demonstrated avoidance of scanner vibration during speed adjustments.

Conclusions:

• The proposed real-time scan speed control method effectively increases AM-AFM imaging speed.
• The algorithm is hardware-independent and simplifies AFM operation.
• This advancement is particularly beneficial for imaging challenging, topographically complex samples.