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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Photoexcited Muon Spin Spectroscopy: A New Method for Measuring Excess Carrier Lifetime in Bulk Silicon

K Yokoyama1,2, J S Lord2, J Miao1,3

  • 1School of Physics and Astronomy, Queen Mary University of London, Mile End, London E1 4NS, United Kingdom.

Physical Review Letters
|December 30, 2017
PubMed

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