Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe
Maja Dukic1, Vencislav Todorov2, Santiago Andany1
1Laboratory for Bio- and Nano-Instrumentation, School of Engineering, Ecole Polytechnique Federale de Lausanne, Lausanne 1015, Switzerland.
This study introduces a digitally controlled analog proportional-integral-derivative (PID) controller for scanning probe microscopes (SPMs). This innovation overcomes limitations of digital controllers, enabling faster scanning speeds and higher resolution atomic force microscopy imaging.
Area of Science:
- Microscopy
- Instrumentation
- Control Systems
Background:
- Scanning probe microscopes (SPMs) rely on feedback controllers for imaging.
- Proportional-integral (PI) controllers are common but limited by digital processing delays.
- These delays restrict scanning speed and imaging resolution in high-speed SPMs.
Purpose of the Study:
- To develop and implement a digitally controlled analog proportional-integral-derivative (PID) controller for SPMs.
- To overcome the speed and resolution limitations imposed by digital feedback controllers.
- To enhance the performance of high-speed SPM imaging.
Main Methods:
- Designed a digitally controlled analog PID feedback controller.
- Implemented tunability of PID gains across wide amplification and frequency ranges.
- Utilized the analog PID controller for atomic force microscopy (AFM) imaging.
Main Results:
- Achieved precise system control and reproducible gain parameters.
- Enabled atomic force microscopy imaging at line rates up to several kHz.
- Demonstrated successful imaging of a standard silicon calibration grating.
Conclusions:
- The developed analog PID controller enhances SPM performance.
- This controller facilitates higher scanning speeds and improved imaging resolution.
- It offers a viable alternative to conventional digital PI controllers for advanced SPM applications.
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