Scanning Electron Microscopy
The Nitrogen Cycle
Electron Microscope Tomography and Single-particle Reconstruction
Electron Carriers
Overview of Nitrogen Metabolism
Leaky Scanning
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Updated: Feb 16, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
S Becker1, N Raatz2, St Jankuhn2
1Division of Nuclear Solid State Physics, Felix Bloch Institute for Solid State Physics, Faculty of Physics and Earth Sciences, Universität Leipzig, Linnéstraße 5, D-04103, Leipzig, Germany. sascha.becker@studserv.uni-leipzig.de.
Researchers developed a simple ion implantation technique using a scanning electron microscope. This method ionizes and implants nitrogen into diamond, creating nitrogen vacancy centers, verified using isotopic labeling.
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