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Published on: December 27, 2024
Anomaly Detection in Nanofibrous Materials by CNN-Based Self-Similarity
Paolo Napoletano1, Flavio Piccoli2, Raimondo Schettini3
1Department of Computer Science, Systems and Communications, University of Milano-Bicocca, Milan 20126, Italy. paolo.napoletano@disco.unimib.it.
This study introduces an automated method for detecting defects in nanofibrous materials using Scanning Electron Microscope (SEM) images. The novel approach enhances quality control by improving anomaly detection accuracy and efficiency.
Area of Science:
- Materials Science
- Computer Vision
- Artificial Intelligence
Background:
- Automated anomaly detection in nanofibrous materials is crucial for cost reduction and efficient quality control.
- Scanning Electron Microscope (SEM) imaging is a key technology for inspecting these materials.
- Current visual inspection methods can be time-consuming and costly.
Purpose of the Study:
- To develop and validate a novel region-based method for automatic anomaly detection and localization in SEM images of nanofibrous materials.
- To improve the efficiency and accuracy of quality control in nanofiber production.
Main Methods:
- A region-based approach utilizing Convolutional Neural Networks (CNNs) and self-similarity.
- Evaluating subregion abnormality by computing CNN-based visual similarity against a dictionary of anomaly-free training data.
- Localization of detected anomalies within the SEM images.
Main Results:
- The proposed method demonstrates superior performance compared to existing state-of-the-art techniques.
- Accurate detection and localization of anomalies in SEM images were achieved.
- Significant reduction in production costs and post-production inspection time is anticipated.
Conclusions:
- The developed CNN-based self-similarity method offers an effective solution for anomaly detection in nanofibrous materials.
- This approach enhances the quality control process in the production of advanced materials.
- The method shows promise for industrial applications requiring high-throughput material inspection.
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