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Updated: Feb 15, 2026
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
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A systematic comparison of on-axis and off-axis transmission Kikuchi diffraction
F Niessen1, A Burrows2, A Bastos da Silva Fanta2
1Danish Hydrocarbon Research and Technology Centre (DHRTC), Technical University of Denmark (DTU), Elektrovej, 2800 Kgs, Lyngby, Denmark.
Ultramicroscopy
|January 17, 2018
Summary
The new on-axis transmission Kikuchi diffraction (TKD) technique offers enhanced pattern intensity and stability compared to off-axis TKD. This advancement allows for faster data acquisition and improved spatial resolution in materials analysis.
Area of Science:
- Materials Science
- Crystallography
- Electron Microscopy
Background:
- Transmission Kikuchi Diffraction (TKD) is a crucial technique for microstructural analysis in electron microscopy.
- Conventional off-axis TKD provides valuable crystallographic information but can be limited by pattern quality and acquisition speed.
- Optimizing TKD parameters is essential for accurate and efficient materials characterization.
Purpose of the Study:
- To systematically compare the capabilities of novel on-axis TKD with conventional off-axis TKD.
- To investigate the influence of experimental parameters on pattern quality and spatial resolution for both TKD configurations.
- To evaluate the advantages of on-axis TKD in terms of pattern intensity, acquisition rate, and stability.
Main Methods:
- Comparative analysis of on-axis and off-axis TKD techniques.
- Systematic variation of experimental parameters including beam current, beam energy, working distance, and detector distance.
- Measurement and evaluation of physical and effective spatial resolution.
- Application of Hough-transform for Kikuchi band detection and indexing.
Main Results:
- On-axis TKD exhibits higher sensitivity to beam current and energy, and lower sensitivity to working and detector distances compared to off-axis TKD.
- Enhanced pattern intensity in on-axis TKD permits reduced beam current or increased acquisition rates.
- Spatial resolution did not significantly differ between configurations, but on-axis TKD is more suitable for large-area mapping due to reduced sensitivity to beam drift.
- Hough-transform band detection yielded, on average, one additional band with on-axis TKD, demonstrating improved stability and performance.
Conclusions:
- On-axis TKD presents significant advantages over off-axis TKD, including improved pattern intensity and stability.
- The technique allows for faster data acquisition and potentially higher spatial resolution measurements over larger areas.
- On-axis TKD is a promising advancement for efficient and detailed microstructural and crystallographic analysis.
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