Semiconductors
Types of Semiconductors
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Dimensional Analysis
Dimensional Analysis
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Updated: Feb 15, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Xinjue Zhong, Kihong Lee, Bonnie Choi
1Computational Laboratory for Hybrid/Organic Photovoltaics (CLHYO), CNR-ISTM , Via Elce di Sotto 8, I-06123 Perugia, Italy.
Researchers developed a novel two-dimensional (2D) semiconductor using linked rhenium-selenium (Re6Se8) clusters. This new material, analogous to Chevrel phases, offers enhanced structural complexity for advanced 2D materials design.
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