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Updated: Feb 15, 2026

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Published on: July 6, 2011

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Note: An innovative method for 12C4+ suppression in 18O6+ beam production in an electron cyclotron resonance ion

Hideshi Muto1, Yukimitsu Ohshiro2, Yasuteru Kotaka2

  • 1Center of General Education, Tokyo University of Science, Suwa, 5000-1 Toyohira, Chino, Nagano 391-0292, Japan.

The Review of Scientific Instruments
|February 3, 2018
PubMed

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