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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase

A Pofelski1, S Y Woo1, B H Le2

  • 1Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada.

Ultramicroscopy
|February 8, 2018
PubMed
Summary

A new scanning transmission electron microscope (STEM) Moiré interferometry technique combined with geometrical phase analysis (GPA) enables precise 2D strain mapping. This method expands STEM GPA capabilities for larger fields of view up to a few microns.

Keywords:
Geometrical phase analysisHolographyMoiré interferometryScanning transmission electron microscopyStrain characterization

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Electron Microscopy

Background:

  • Accurate strain characterization is crucial for understanding material properties.
  • Conventional methods in scanning transmission electron microscopy (STEM) have limitations in field of view for strain mapping.

Purpose of the Study:

  • To demonstrate a novel strain characterization technique using STEM Moiré interferometry and geometrical phase analysis (GPA).
  • To extend the capabilities of high-resolution STEM GPA for quantitative 2D strain mapping over larger areas.

Main Methods:

  • Utilized Moiré interferometry within a STEM setup to capture deformation fields in STEM Moiré holograms.
  • Applied sampling theory and STEM electron micrograph references to simulate Moiré patterns and extract crystal lattice information.
  • Employed geometrical phase analysis (GPA) to extract 2D relative strain and rotation fields from the processed data.

Main Results:

  • Successfully demonstrated a technique combining STEM Moiré interferometry and GPA for strain characterization.
  • Achieved de-magnification of local information to a large length scale, comparable to dark-field electron holography.
  • Extended conventional STEM GPA by enabling quantitative 2D strain mapping with a field of view up to a few microns.

Conclusions:

  • The developed STEM Moiré GPA method offers enhanced capabilities for materials characterization.
  • This technique provides a valuable tool for analyzing strain distributions in materials with a larger field of view.
  • The method bridges the gap between high-resolution local analysis and broader area characterization in electron microscopy.