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Three-Dimensional Analysis of Peeled Internal Limiting Membrane Using Focused Ion Beam/Scanning Electron Microscopy

Akira Hirata1,2, Kazuhisa Murata3, Ken Hayashi1

  • 1Hayashi Eye Hospital, Fukuoka, Japan.

Translational Vision Science & Technology
|February 10, 2018
PubMed
Abstract

Insights

Internal limiting membrane peeling during vitrectomy for epiretinal membrane causes more Müller cell damage than for macular hole. Focused ion beam/scanning electron microscopy revealed significant cell fragments, indicating higher inner retinal damage risk in epiretinal membrane surgery.

Area of Science:

  • Ophthalmology
  • Cell Biology
  • Surgical Science

Background:

  • Internal limiting membrane (ILM) peeling is a common surgical step in vitrectomy.
  • Müller cells are crucial for retinal structure and function.
  • Assessing ILM peeling's impact on Müller cells is vital for surgical safety.

Purpose of the Study:

  • To reevaluate the effect of ILM peeling during vitrectomy on Müller cell damage.
  • To analyze the ultrastructure of the ILM using focused ion beam/scanning electron microscopy (FIB/SEM).

Main Methods:

  • Examined 12 ILMs from macular hole and idiopathic epiretinal membrane surgeries using FIB/SEM.
  • Analyzed the three-dimensional structures of the ILM.
  • Quantified cell fragments on the ILM surface.

Main Results:

  • Epiretinal membrane (ERM) group showed significantly higher numbers (12.85/100 μm²) and total volume (10.45 μm³/100 μm²) of cell fragments compared to the macular hole (MH) group (5.07/100 μm² and 3.54 μm³/100 μm²).
  • P-values were 0.0024 for cell number and 0.0022 for total volume, indicating statistical significance.
  • No significant difference in mean cell fragment volume between MH and ERM groups.

Conclusions:

  • All examined ILMs had cell fragments on their retinal surface.
  • ERM peeling resulted in more cell fragments than MH peeling, suggesting increased inner retinal damage risk.
  • FIB/SEM is an effective tool for three-dimensional quantitative analysis of the ILM.
Keywords:
epiretinal membranefocused ion beam/scanning electron microscopyinternal limiting membranemacular holevitrectomy

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