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Published on: July 6, 2011
Three-Dimensional Analysis of Peeled Internal Limiting Membrane Using Focused Ion Beam/Scanning Electron Microscopy
Akira Hirata1,2, Kazuhisa Murata3, Ken Hayashi1
1Hayashi Eye Hospital, Fukuoka, Japan.
Internal limiting membrane peeling during vitrectomy for epiretinal membrane causes more Müller cell damage than for macular hole. Focused ion beam/scanning electron microscopy revealed significant cell fragments, indicating higher inner retinal damage risk in epiretinal membrane surgery.
Area of Science:
- Ophthalmology
- Cell Biology
- Surgical Science
Background:
- Internal limiting membrane (ILM) peeling is a common surgical step in vitrectomy.
- Müller cells are crucial for retinal structure and function.
- Assessing ILM peeling's impact on Müller cells is vital for surgical safety.
Purpose of the Study:
- To reevaluate the effect of ILM peeling during vitrectomy on Müller cell damage.
- To analyze the ultrastructure of the ILM using focused ion beam/scanning electron microscopy (FIB/SEM).
Main Methods:
- Examined 12 ILMs from macular hole and idiopathic epiretinal membrane surgeries using FIB/SEM.
- Analyzed the three-dimensional structures of the ILM.
- Quantified cell fragments on the ILM surface.
Main Results:
- Epiretinal membrane (ERM) group showed significantly higher numbers (12.85/100 μm²) and total volume (10.45 μm³/100 μm²) of cell fragments compared to the macular hole (MH) group (5.07/100 μm² and 3.54 μm³/100 μm²).
- P-values were 0.0024 for cell number and 0.0022 for total volume, indicating statistical significance.
- No significant difference in mean cell fragment volume between MH and ERM groups.
Conclusions:
- All examined ILMs had cell fragments on their retinal surface.
- ERM peeling resulted in more cell fragments than MH peeling, suggesting increased inner retinal damage risk.
- FIB/SEM is an effective tool for three-dimensional quantitative analysis of the ILM.
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