Fast Focal Point Correction in Prism-Coupled Total Internal Reflection Scanning Imager Using an Electronically

Chenggang Zhu1, Bilin Ge2, Ru Chen3

  • 1Department of Optical Science and Engineering, Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education), Fudan University, Shanghai 200433, China. 16110720026@fudan.edu.cn.

Summary

An electrically tunable lens corrects focal length in total internal reflection (TIR) microscopy, expanding sensing areas. This innovation enables rapid, high-resolution imaging of interfaces without mechanical lens movement, reducing noise and drift.

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