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Updated: Feb 14, 2026

Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM
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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM

Published on: October 2, 2012

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Comprehensive approach to the validation of the standard method for total reflection X-ray fluorescence analysis of

Laura Borgese1, Rogerta Dalipi2, Alessandro Riboldi1

  • 1INSTM & Chemistry for Technologies Laboratory, Department of Mechanical and Industrial Engineering, University of Brescia, Via Branze 38, 25123 Brescia, Italy.

Talanta
|February 11, 2018
PubMed

Keywords:
CalibrationElementsTXRFValidationWater

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