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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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Performance enhancement of carbon nanotube thin film transistor by yttrium oxide capping

Jiye Xia1, Jie Zhao, Hu Meng

  • 1Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, P.R. China. liangxl@pku.edu.cn.

Nanoscale
|February 17, 2018
PubMed

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