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Published on: September 13, 2021
Evaluation of electron tomography reconstruction methods for interface roughness measurement
Misa Hayashida1, Shinichi Ogawa2, Marek Malac1,3
1Nanotechnology Research Centre, National Research Council, Edmonton, T6G 2M9, Canada.
Abstract:
We evaluate the suitability of simultaneous iterative reconstruction technique (SIRT), filtered back projection, and simultaneous algebraic reconstruction technique methods for buried interface roughness measurements. We also investigate the effect of total electron dose distributed over the entire tilt series on measured roughness values. We investigate the applicability of the dose fractionation theorem by evaluating the effect of an increasing number of images, i.e., decreasing tilt increment size at fixed total electron irradiation dose on the quantitative measurement of buried interface roughness. The results indicate that SIRT is the most suitable method for reconstruction and a 3° to 5° angle is optimal for the roughness measurement.
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