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Updated: Feb 14, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Wen Chen1, Shunping Zhang1, Qian Deng1
1School of Physics and Technology, Center for Nanoscience and Nanotechnology, and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Wuhan University, 430072, Wuhan, China.
This study demonstrates cavity plasmons in a metal nanowire-on-mirror setup for ultrasensitive vertical dimensional measurements. This plasmon ruler achieves sub-picometer resolution, ideal for advanced sensing applications.
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