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Updated: Feb 14, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
Georges Goetz1,2, Tong Ling1,3, Tushar Gupta4
1Hansen Experimental Physics Laboratory, Stanford University, Stanford, CA 94305; ggoetz@alumni.stanford.edu tongling@stanford.edu palanker@stanford.edu.
We developed sensitive optical techniques to measure material properties by detecting transient thermal changes. These methods enable rapid, single-shot mapping of properties in biological and semiconductor samples.
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