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Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface
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X-ray reflectivity from curved liquid interfaces.

Sven Festersen1, Stjepan B Hrkac1, Christian T Koops1

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|March 1, 2018
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Summary

Researchers developed a novel X-ray reflectivity method using liquid drop curvature. This technique overcomes limitations of traditional liquid surface diffractometers, enabling detailed interface structure analysis.

Keywords:
X-ray reflectivityfree-elecron laserliquid interfacesmethodssynchrotron

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Area of Science:

  • Materials Science
  • Surface Science
  • X-ray Physics

Background:

  • X-ray reflectivity (XRR) is crucial for studying liquid interfaces.
  • Modern X-ray sources (e.g., free-electron lasers) require specialized liquid surface diffractometers for XRR.
  • Current limitations hinder XRR studies of liquid surfaces at advanced facilities.

Purpose of the Study:

  • To present an alternative experimental approach for X-ray reflectivity studies of liquid interfaces.
  • To overcome the lack of dedicated liquid surface diffractometers.
  • To enable XRR analysis at modern X-ray sources.

Main Methods:

  • Utilizing the natural curvature of a liquid drop to vary the angle of incidence.
  • Employing two operational modes: nanometre beam sequential measurements and micrometre beam parallel acquisition.
  • Demonstrating feasibility with Hg/vapour, H2O/vapour, and Hg/NaF interfaces.

Main Results:

  • Achieved reflectivity curves matching conventional techniques.
  • Extended angular range up to 5αc (micro-beam) and 35αc (nano-beam).
  • Successfully observed the mercury (Hg) layering peak at the interface.

Conclusions:

  • The liquid drop curvature method is a viable alternative for X-ray reflectivity studies.
  • This approach circumvents the need for dedicated liquid surface diffractometers.
  • Enables advanced structural analysis of liquid-vapour and liquid-liquid interfaces.