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Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
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Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

Nicholas Winograd1

  • 1Department of Chemistry, Pennsylvania State University, University Park, Pennsylvania 16802, USA;

Annual Review of Analytical Chemistry (Palo Alto, Calif.)
|March 1, 2018
PubMed

Keywords:
bioimagingcluster ion beamsinstrumentationmolecular depth profilingmolecular dynamics computer simulationsphospholipids

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