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Updated: Feb 13, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Observation of Nanosecond Hot Carrier Decay in Graphene
Lin Fan1, Suk Kyoung Lee1, Pai-Yen Chen2
1Department of Chemistry , Wayne State University , Detroit , Michigan 48202 , United States.
Abstract:
An extremely long decay time of hot carriers in graphene at room temperature was observed for the first time by monitoring the photoinduced thermionic emission using a highly sensitive time-of-flight angle-resolved photoemission spectroscopy method. The emission persisted beyond 1 ns, two orders of magnitude longer than previously reported carrier decay. The long lifetime was attributed to the excitation of image potential states at very low laser fluencies.
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