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The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
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Synthetic-wavelength-based dual-comb interferometry for fast and precise absolute distance measurement
Optics Express
|March 14, 2018
Summary
This study introduces a dual-comb ranging system for precise absolute distance measurements. The system achieves sub-nanometer precision, enhancing industrial applications with fast, accurate measurements.
Area of Science:
- Optical Metrology
- Precision Engineering
- Interferometry
Background:
- Absolute distance measurement is crucial for industrial applications.
- Dual-comb systems offer high potential for precise metrology.
- Combining multiple ranging methods can overcome individual limitations.
Purpose of the Study:
- To develop an absolute distance measurement system using a phase-stable dual-comb setup.
- To integrate time-of-flight (TOF), synthetic-wavelength interferometry (SWI), and carrier wave interferometry (CWI) for enhanced performance.
- To achieve high precision and fast measurement rates for industrial applications.
Main Methods:
- Utilizing a phase-stable dual-comb system with specific repetition rates.
- Implementing a mutual locking scheme for relative phase stability between combs.
- Combining TOF, SWI, and CWI methods for simultaneous ranging.
Main Results:
- Achieved a precision of 1.2 μm without averaging.
- Improved precision to 3 nm with 10 ms averaging using SWI.
- Reached sub-nanometer precision with averaging times exceeding 0.1 s.
- Demonstrated an ambiguity range of approximately 2.67 m.
Conclusions:
- The developed dual-comb ranging system offers high accuracy and fast measurement capabilities.
- The combined ranging methods enhance precision and measurement rates.
- The system shows significant potential for various industrial applications requiring precise distance measurements.
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