Related Experiment Video
Updated: Feb 13, 2026
11:16
Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles
Published on: August 7, 2016
10.2K
Blind estimation of DED camera gain in Electron Microscopy.
C O S Sorzano1, E Fernández-Giménez2, V Peredo-Robinson2
1Centro Nac. Biotecnología (CSIC), c/Darwin, 3, 28049 Cantoblanco, Madrid, Spain; Univ. San Pablo - CEU, Campus Urb. Montepríncipe, 28668 Boadilla del Monte, Madrid, Spain.
Journal of Structural Biology
|March 20, 2018
Summary
A new method estimates Direct Electron Detector (DED) camera gain from microscope movies. This approach ensures consistent image quality and helps identify faulty pixels or calibration issues in structural biology.
Area of Science:
- Microscopy
- Structural Biology
- Biophysics
Background:
- Direct Electron Detectors (DEDs) have significantly advanced Single Particle Analysis (SPA) in electron microscopy.
- Accurate camera gain estimation is crucial for homogeneous image quality in DED movies.
- Existing methods may require external calibration or lack dynamic gain assessment.
Purpose of the Study:
- To develop and validate an algorithm for estimating DED camera gain directly from movie data.
- To provide a self-contained method for assessing pixel-level gain variations.
- To support the identification of dead pixels and camera calibration inaccuracies.
Main Methods:
- An algorithm was developed to calculate pixel-specific gain values solely from DED movie frames.
- The method processes the DED movie to generate a gain image.
- The algorithm was tested on various DED camera models (DE, Falcon II, Falcon 3, K2).
Main Results:
- The algorithm successfully estimates camera gain from DED movies without external input.
- The generated gain images aid in identifying dead pixels and calibration errors.
- The method can validate existing experimental gain images and confirm successful gain correction.
Conclusions:
- This intrinsic gain estimation method enhances the reliability of DED data in structural biology.
- The algorithm offers a robust tool for quality control and validation of electron microscopy data.
- It provides a valuable approach for ensuring data integrity and optimizing image analysis workflows.
Related Concept Videos
02:07Blind Procedures
13.7K
Ideally, the people who observe and record the children’s behavior are unaware of who was assigned to the experimental or control group, in order to control for experimenter bias. Experimenter bias refers to the possibility that a researcher’s expectations might skew the results of the study. Remember, conducting an experiment requires a lot of planning, and the people involved in the research project have a vested interest in supporting their hypotheses. If the observers knew which...
13.7K
01:11Blinding
4.0K
Blinding is a commonly used method of not telling participants which treatment a subject is receiving. Blinding is a critical part of a randomized control trial or RCT. It reduces the bias that affects the results. In an RCT, blinding is used in the form of a placebo. A placebo effect occurs when untreated subjects falsely believe they have received the treatment and report improved symptoms. A placebo or a dummy treatment is administered to subjects to negate the bias caused by such an effect.
4.0K
01:15Gain
449
Gain and phase shift are properties of linear circuits that describe the effect a circuit has on a sinusoidal input voltage or current. The circuit's behavior that contains reactive elements will depend on the frequency of the input sinusoid. As a result, it is observed that the gain and phase shift will all be frequency functions.
Gain:
Suppose Vin is the input and Vout is the output signal to a circuit.
Gain:
Suppose Vin is the input and Vout is the output signal to a circuit.
449
01:25Overview of Electron Microscopy
15.5K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
15.5K
01:07Scanning Electron Microscopy
5.6K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Fundamental Principles
Accelerated...
5.6K
01:15Transmission Electron Microscopy
7.3K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
7.3K