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Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution
Le Yang1, Hao-Sen Chen, Hanqing Jiang
1State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing, 100871, China.
Abstract:
An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.
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