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Updated: Feb 12, 2026

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
Published on: September 13, 2020
Effect of nitrogen plasma afterglow on the surface charge effect resulted during XPS surface analysis of amorphous
1Department of Physics, Faculty of Science, Damascus University, Syria.
Abstract:
The aim of this paper is to investigate the relationship between the micro structure and the surface charge effect resulted during XPS surface analysis of amorphous carbon nitride thin films prepared by laser ablation method. The study results show that the charge effect coefficient (E) is not just a correction factor. We found that the changes in this coefficient value due to incorporation of nitrogen atoms into the carbon network are related to the spatial configurations of the sp2 bonded carbon atoms, order degree and sp2 clusters size. In addition, results show that the curve E vs. C(sp3)-N is a characteristic curve of the micro structure. This means that using this curve makes it easy to sorting the samples according to the micro structure (hexagonal rings or chains).
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