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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
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Atoms and molecules interact through bonds (or forces): intramolecular and intermolecular. The forces are electrostatic as they arise from interactions (attractive or repulsive) between charged species (permanent, partial, or temporary charges) and exist with varying strengths between ions, polar, nonpolar, and neutral molecules. The different types of intermolecular forces are ion–dipole, dipole–dipole, hydrogen bonds, and dispersion; among these, dipole–dipole, hydrogen...
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Atoms — and the protons, neutrons, and electrons that compose them — are extremely small. For example, a carbon atom weighs less than 2 × 10−23 g. When describing the properties of tiny objects such as atoms, we use appropriately small units of measure, such as the atomic mass unit (amu). The amu was originally defined based on hydrogen, the lightest element, then later in terms of oxygen. Since 1961, it has been defined with regard to the most abundant isotope of carbon, atoms of which...
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In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
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Optimal sampling and reconstruction of undersampled atomic force microscope images using compressive sensing.

Guoqiang Han1, Bo Lin1

  • 1School of Mechanical Engineering and Automation, Fuzhou University, 2 Xueyuan Road, Fuzhou, China.

Ultramicroscopy
|April 8, 2018
PubMed
Summary
This summary is machine-generated.

Compressive sensing (CS) significantly speeds up Atomic Force Microscopy (AFM) imaging by reducing data acquisition. This method enhances measurement speed without compromising the quality of AFM surface images.

Keywords:
Atomic force microscope (AFM)Compressed sensing (CS)Reconstruction algorithmsScan patternsUndersampling

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is crucial for analyzing material surface structure and morphology.
  • Standard AFM imaging is time-consuming, potentially leading to sample damage due to prolonged probe interaction.

Purpose of the Study:

  • To apply compressive sensing (CS) to reduce AFM imaging time and minimize sample damage.
  • To investigate the impact of sampling patterns and reconstruction algorithms on AFM image quality.

Main Methods:

  • Implemented compressive sensing (CS) techniques for AFM data acquisition.
  • Utilized various sampling patterns (e.g., Random Scan, Spiral Scan) and reconstruction algorithms (e.g., l1-ls, TVAL3).
  • Evaluated reconstructed images using quality indicators like Peak Signal-to-Noise Ratio (PSNR) and Structural Similarity Index Measure (SSIM).

Main Results:

  • The choice of sampling pattern and reconstruction algorithm critically affects reconstructed AFM image quality.
  • Compressive sensing (CS) successfully reduced measurement data requirements.
  • Accurate AFM images were obtained with significantly reduced data, demonstrating the efficacy of CS.

Conclusions:

  • Compressive sensing (CS) is a viable method to accelerate AFM measurements.
  • CS improves AFM measurement speed without sacrificing image quality.
  • This approach minimizes probe-sample interactions, preventing potential sample damage.