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Updated: Feb 11, 2026

Preparing Adherent Cells for X-ray Fluorescence Imaging by Chemical Fixation
Published on: March 12, 2015
Confocal total reflection X-ray fluorescence technology based on an elliptical monocapillary and a parallel
Yu Zhu1, Yabing Wang1, Tianxi Sun2
1Key Laboratory of Beam Technology of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China; Beijing Radiation Center, Beijing 100875, China.
Abstract:
A total reflection X-ray fluorescence (TXRF) spectrometer based on an elliptical monocapillary X-ray lens (MXRL) and a parallel polycapillary X-ray lens (PPXRL) was designed. This TXRF instrument has micro focal spot, low divergence and high intensity of incident X-ray beam. The diameter of the focal spot of MXRL was 16.5 µm, and the divergence of the incident X-ray beam was 3.4 mrad. We applied this TXRF instrument to the micro analysis of a single-layer film containing Ni deposited on a Si substrate by metal vapor vacuum arc ion source.
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