Semiconductors
Types of Semiconductors
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Colors and Magnetism
The Wave Nature of Light
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Updated: Feb 11, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
1Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden. vassilios.kapaklis@physics.uu.se.
No abstract available in PubMed .