Stochastic Model of Breakdown Nucleation under Intense Electric Fields.

Area of Science:

• Materials Science
• Solid-State Physics
• Electrical Engineering

Background:

• Electrical breakdown in materials is a critical phenomenon.
• Dislocation activity is a known mechanism for plastic deformation.
• The role of dislocations in electrical breakdown under intense fields requires further investigation.

Purpose of the Study:

• To propose and model a mechanism for electrical breakdown originating from dislocation activity under intense electric fields.
• To investigate the formation of protrusions and subsequent arcing due to this mechanism.
• To establish a simplified dependence of breakdown rates on electric field and temperature.

Main Methods:

• Formulation of a physical model based on stochastic multiplication and arrest of dislocations.
• Utilizing Monte Carlo simulations to study the model.
• Employing theoretical analysis to derive simplified dependencies.

Main Results:

• A critical transition in dislocation population is identified as the cause of protrusion formation.
• The model successfully explains subsequent arcing.
• A simplified dependence of breakdown rates on electric field was derived.
• The model's predictions align with experimental observations of field and temperature dependencies.

Conclusions:

• Plastic response from dislocation activity under intense electric fields is a viable source of electrical breakdown.
• The proposed model provides a framework for understanding protrusion formation and arcing.
• The derived simplified dependencies offer insights into material behavior under high electrical stress.