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Stochastic Model of Breakdown Nucleation under Intense Electric Fields
Eliyahu Zvi Engelberg1, Yinon Ashkenazy1, Michael Assaf1
1Racah Institute of Physics and the Center for Nanoscience and Nanotechnology, Hebrew University of Jerusalem, Jerusalem 9190401, Israel.
Abstract:
A plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.
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