Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling

Related Experiment Video

Updated: Feb 11, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM
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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Published on: February 10, 2021

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Yushu Shi1, Wei Li2, Sitian Gao2

  • 1State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China; National Institute of Metrology, Beijing 100029, China.

Ultramicroscopy
|April 29, 2018
PubMed

Keywords:
Atomic force microscopeNanometrologyScanning headSurface topography

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