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Related Experiment Video

Updated: Feb 11, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Study of Higher Diffraction Order Contribution in a Flat Field Grating Spectrograph Using a High-Order Harmonic

Mukund Kumar1,2, Himanshu Singhal1,2, Juzer A Chakera1,2

  • 11 Laser Plasma Section, Raja Ramanna Centre for Advanced Technology, Indore, India.

Applied Spectroscopy
|May 2, 2018
PubMed
Summary
This summary is machine-generated.

This study characterizes a flat-field grating spectrograph

Keywords:
FFGSFlat-field grating spectrographHOHVLS gratinghigh-order harmonicshigher diffraction ordersvariable line-spacing grating

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Area of Science:

  • Spectroscopy
  • Optics
  • X-ray physics

Background:

  • Flat-field grating spectrographs (FFGS) are crucial for spectral analysis.
  • Investigating higher diffraction orders is essential for accurate spectral measurements.

Purpose of the Study:

  • To characterize the performance of a FFGS in higher diffraction orders.
  • To evaluate the efficiency of photon diffraction in various orders.

Main Methods:

  • Experimental characterization of a FFGS using high-order harmonic radiation.
  • Utilized an aberration-corrected, variable line spacing spherical grating.
  • Employed Ti:sapphire laser pulses interacting with inert gas-filled cells.

Main Results:

  • Observed significant second-order diffraction (up to ~65% at ~80 Å).
  • Second-order diffraction decreased to ~15% at ~150 Å.
  • Third-order diffraction was substantially lower (~15% at ~100 Å).

Conclusions:

  • Results align with REFLEC software calculations and INDUS-1 beamline measurements.
  • High-order harmonic sources enable efficient estimation of diffraction orders in single shots.
  • Findings are valuable for estimating conversion efficiency and photon flux with VLS grating spectrographs.