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Cell Culture on Silicon Nitride Membranes and Cryopreparation for Synchrotron X-ray Fluorescence Nano-analysis
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Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications.

H Joress1, J D Brock1, A R Woll1

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|May 2, 2018
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Summary

A novel parallel X-ray reflectivity (XRR) technique enables in situ thin-film growth observation. This method uses a polycapillary optic and area detector for rapid, high-resolution data collection, compatible with synchrotron sources.

Keywords:
X-ray reflectivityfilm growthin situquick XRRtime-resolved

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Surface Science

Background:

  • X-ray reflectivity (XRR) is crucial for analyzing thin-film structures.
  • Traditional XRR methods can be time-consuming, limiting in situ studies.
  • Existing parallel collection techniques have limitations with synchrotron radiation.

Purpose of the Study:

  • To develop and validate a new parallel X-ray reflectivity (XRR) technique for in situ thin-film growth monitoring.
  • To enhance the speed and applicability of XRR for dynamic material processes.
  • To create a method compatible with monochromatic synchrotron radiation and flat substrates.

Main Methods:

  • Utilized a polycapillary X-ray optic to create a converging radiation fan incident on the sample.
  • Employed an area detector for simultaneous XRR signal collection over a wide angular range.
  • Characterized factors influencing reciprocal space range, instrumental resolution, and signal-to-background ratio.

Main Results:

  • Achieved simultaneous XRR data collection over ~5° in 2θ.
  • Successfully resolved Kiessig fringes for layer thicknesses from 3 to 76 nm.
  • Demonstrated 100 ms time resolution during epitaxial La0.7Sr0.3MnO3 growth on SrTiO3.

Conclusions:

  • The developed parallel XRR technique offers significant improvements in speed and versatility.
  • This method is sample-independent and compatible with third-generation synchrotron sources.
  • The technique is adaptable for laboratory-based X-ray sources, broadening its accessibility.