Related Experiment Video
Updated: Feb 11, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Substrate aberration and correction for meta-lens imaging: an analytical approach
Abstract:
Meta-lenses based on flat optics enabled a fundamental shift in lens production-providing an easier manufacturing process with an increase in lens profile precision and a reduction in size and weight. Here we present an analytical approach to correct spherical aberrations caused by light propagation through the substrate by adding a substrate-corrected phase profile, which differs from the original hyperbolic one. A meta-lens encoding the new phase profile would yield diffraction-limited focusing and an increase of up to 0.3 of its numerical aperture without changing the radius or focal length. In tightly focused laser spot applications such as direct laser lithography and laser printing, a substrate-corrected meta-lens can reduce the spatial footprint of the meta-lens.
More Related Videos
06:26Meta-analysis of Voxel-Based Neuroimaging Studies using Seed-based d Mapping with Permutation of Subject Images SDM-PSI
Published on: November 27, 2019
05:46Author Spotlight: Advancements in Refractive Surgical Correction for Presbyopia and Exploring Postoperative Visual Acuity
Published on: September 20, 2024
Related Concept Videos
Distance Corrections
Power Factor Correction
Directing Effect of Substituents: meta-Directing Groups
Development of Analytical Methods
Analyte Adsorption and Distribution
Jung's Analytical Theory