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Updated: Feb 11, 2026

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
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Compact system for near edge X-ray fine structure (NEXAFS) spectroscopy using a laser-plasma light source
Optics Express
|May 3, 2018
Summary
A new compact laboratory system for Near Edge Soft X-ray Fine Structure (NEXAFS) spectroscopy was developed using a laser-plasma source. This system successfully analyzes sample composition via soft X-ray emission and absorption spectra.
Area of Science:
- Atomic and Molecular Physics
- Materials Science
- Spectroscopy
Background:
- Soft X-ray spectroscopy is crucial for material analysis.
- Developing compact, laboratory-based systems is essential for wider accessibility.
- Laser-plasma sources offer a promising alternative to large synchrotron facilities.
Purpose of the Study:
- To develop a compact laboratory system for Near Edge Soft X-ray Fine Structure (NEXAFS) spectroscopy.
- To utilize a laser-plasma light source for efficient soft X-ray generation.
- To demonstrate the system's capability in analyzing material composition.
Main Methods:
- A laser-plasma source was engineered using a double stream gas puff target (krypton/helium).
- Soft X-ray emission (1.5–5 nm) was optimized for spectral analysis.
- A grazing incidence spectrometer was employed for simultaneous emission and absorption measurements in transmission mode.
Main Results:
- The system successfully acquired emission and absorption spectra.
- Analysis of the carbon K-α absorption edge in PET film revealed its composition.
- Experimental data demonstrated good agreement with synchrotron-based measurements.
Conclusions:
- The developed compact laser-plasma NEXAFS system is a viable alternative to synchrotron sources.
- The system provides accurate material composition analysis.
- This advancement facilitates broader application of NEXAFS spectroscopy in laboratory settings.
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