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Published on: November 8, 2012
1Graduate School of Engineering, Kyoto University, Kyoto, 615-8540, Japan hayashi@kuaero.kyoto-u.ac.jp.
Scanning laser source (SLS) defect imaging was improved using diffuse field concepts to reduce spurious images. Broadband chirp excitation and low-attenuation materials yield clearer defect imaging results.
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