Related Experiment Video
Updated: Feb 11, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance
Xiaoyu Wu1, Zhenqi Hao2, Di Wu1
1Department of Physics, University of Texas at Austin, Austin, Texas 78712, USA.
Abstract:
We report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated MoS2 field effect transistors, and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.
More Related Videos
Related Concept Videos
The DNA Replication Fork
The DNA Replication Fork
Restarting Stalled Replication Forks
Restarting Stalled Replication Forks
Susceptibility, Permittivity and Dielectric Constant
Impedance Combination

