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Updated: Feb 11, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
W Koopman1, M Muccini2, S Toffanin2
1Institute of Physics and Astronomy, University of Potsdam, Karl-Liebknecht-Str. 24-25, Potsdam 14476, Germany.
We enhanced Photoluminescence Electro-Modulation (PLEM) microscopy for organic semiconductors. This new method improves resolution and contrast for imaging charge distribution in transistors, revealing local variations.
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