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Updated: Feb 11, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Note: Microelectrode-shielding tip for scanning probe electron energy spectroscopy.

Wei Huang¹, Zhean Li¹, Chunkai Xu¹

¹Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China.

The Review of Scientific Instruments

|May 3, 2018

Summary

This summary is machine-generated.

A new microelectrode-shielding tip (ME tip) allows for closer sample analysis in scanning probe electron energy spectroscopy (SPEES). This innovation enables detailed measurements at reduced tip-sample distances, improving spectral acquisition and simultaneous topography mapping.

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Area of Science:

Materials Science
Surface Science
Analytical Chemistry

Background:

Scanning Probe Electron Energy Spectroscopy (SPEES) is a powerful surface analysis technique.
Conventional tips in SPEES face limitations in achieving close tip-sample proximity due to signal interference.

Purpose of the Study:

To introduce and evaluate a novel microelectrode-shielding tip (ME tip) for SPEES.
To assess the shielding effect and performance enhancement of the ME tip compared to normal tips.

Main Methods:

Experimental comparison of detection efficiency between ME tip and normal tip.
Simulations to analyze the shielding effect of the ME tip.
In situ topography acquisition using the ME tip.

Main Results:

The ME tip maintains detection efficiency at significantly closer tip-sample distances (within 1 μm) compared to normal tips (within 21 μm).
Reduced signal drop-off indicates improved performance and allows for measurements at closer proximity.
Simultaneous in situ topography mapping of the sample surface was achieved.

Conclusions:

The novel ME tip significantly enhances SPEES capabilities by enabling closer tip-sample interactions.
This advancement allows for more detailed electron energy spectra acquisition and simultaneous surface topography.
The ME tip represents a valuable development for high-resolution surface analysis.