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Statistical Modelling of Cortical Connectivity Using Non-invasive Electroencephalograms
Published on: November 1, 2019
Bertrand Fournier1, Benoît Guillot2, Claude Lecomte2
1Institut Galien Paris Sud, UMR CNRS 8612, Université Paris Sud, Faculté de Pharmacie, Université Paris-Saclay, 5 rue Jean-Baptiste Clément, Châtenay-Malabry, 92296, France.
A new method estimates uncertainties in charge-density models by calculating sample standard deviations (SSD) from varied models. This approach provides reliable error estimates for various properties, enhancing crystallographic analysis.
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