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Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution.

Florian Winkler1,2, Juri Barthel1,3, Amir H Tavabi1,2

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Summary
This summary is machine-generated.

An automated algorithm precisely matches experimental and simulated atomic-resolution electron holography data. This method accurately determines specimen properties like thickness and tilt, crucial for nanoscale material analysis.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Electron Microscopy

Background:

  • Quantitative analysis of nanoscale materials requires precise knowledge of experimental parameters.
  • Electron holography offers high spatial resolution but is sensitive to experimental conditions and aberrations.
  • Accurate determination of specimen properties and imaging parameters is essential for reliable data interpretation.

Purpose of the Study:

  • To demonstrate an absolute scale match between experimental and simulated atomic-resolution off-axis electron holography.
  • To develop an automated method for determining unknown experimental parameters directly from the electron wave function.
  • To assess the capability of the method for measuring local specimen properties and electron optical aberrations.

Main Methods:

  • Utilized atomic-resolution off-axis electron holography.
  • Developed and applied an automated numerical algorithm to analyze recorded electron wave functions.
  • Performed measurements on a pristine thin tungsten diselenide (WSe_{2}) flake.

Main Results:

  • Achieved an absolute scale match between experimental and simulation data.
  • Successfully and uniquely measured local thickness and tilt of the WSe_{2} flake.
  • Found that some electron optical aberrations could not be unambiguously determined for periodic objects.

Conclusions:

  • The developed automated method enables direct determination of local specimen and imaging parameters from electron wave functions.
  • This capability is vital for quantitative studies of electrostatic potentials in nanoscale materials, especially during in situ experiments.
  • The method's robustness in determining parameters that can change over time enhances its utility for dynamic nanoscale investigations.