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Related Experiment Video

Updated: Feb 10, 2026

Using a Cyclic Ion Mobility Spectrometer for Tandem Ion Mobility Experiments

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Published on: January 20, 2022

Ion mobility spectrometer with orthogonal X-Ray source for increased sensitivity.

Erik Bunert¹, Tobias Reinecke¹, Ansgar T Kirk¹

¹Leibniz Universität Hannover, Institute of Electrical Engineering and Measurement Technology, Department of Sensors and Measurement Technology, Appelstr. 9A, 30167 Hannover, Germany.

|May 16, 2018

Summary

This summary is machine-generated.

Ion mobility spectrometers (IMS) using X-ray sources offer a legal alternative to radioactive ionization. Orthogonally mounting the X-ray source significantly improves signal-to-noise ratio for sensitive volatile compound detection.

Keywords:

Ion Mobility Spectrometry Non-radioactive ionization source Orthogonal X-ray source X-ray IMS X-ray ionization

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

Area of Science:

Analytical Chemistry
Instrumental Analysis
Spectrometry

Background:

Ion mobility spectrometers (IMS) are sensitive detectors for volatile compounds.
Traditional IMS use radioactive sources (e.g., 63Ni, 3H), facing legal restrictions and fixed emission intensity.
Previous work introduced X-ray sources as a legal alternative, but axial mounting caused increased Fano noise.

Purpose of the Study:

To evaluate the analytical performance of an ion mobility spectrometer with an orthogonally mounted X-ray source.
To compare this new setup against a previously developed axially mounted X-ray source configuration.
To demonstrate the reduction in noise and improvement in signal-to-noise ratio.

Main Methods:

Replaced the axially mounted X-ray source in an IMS with an orthogonally mounted one.
Operated the X-ray source at a low acceleration voltage (4.5 kV).
Compared analytical performance, focusing on noise levels and signal-to-noise ratio, with the previous axial setup.

Main Results:

The orthogonal X-ray source setup significantly reduced noise levels.
Signal-to-noise ratio improved from 700 (axial) to over 3000 (orthogonal).
Resolving power remained high at R = 100, with low pptv detection limits achieved.

Conclusions:

Orthogonal mounting of X-ray sources in IMS effectively minimizes Fano noise.
This configuration enhances sensitivity and maintains excellent resolving power for volatile compound analysis.
The improved IMS offers a legally compliant, high-performance solution for trace gas detection.