Milgram's Obedience to Authority
Semiconductors
Types of Semiconductors
Distance Corrections
Stress-Strain Diagram - Ductile Materials
Power Factor Correction
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Feb 9, 2026

Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Published on: December 7, 2015
Xun Shi1, Hongyi Chen1,2, Feng Hao1,3
1State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai, China.
This study corrects a data error in Figure 3d, adjusting the x-axis range for accurate scientific representation. The corrected figure now accurately reflects the experimental data from 0 to 12.
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
08:21Determination of Inorganic Arsenic in a Wide Range of Food Matrices using Hydride Generation - Atomic Absorption Spectrometry.
Published on: September 1, 2017
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: