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Updated: Feb 9, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
A Smirnov1, V M Yasinskii2, D S Filimonenko2
1Laboratoire de Physique de la Matière Vivante, IPHYS, Ecole Polytechnique Fédérale de Lausanne, BSP-408, 1015 Lausanne, Switzerland.
This study explores using bent fiber probes for tapping mode scanning near-field optical microscopy. Careful probe design is crucial for achieving the desired tapping feedback, enhancing imaging capabilities.
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