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Lateral position correction in ptychography using the gradient of intensity patterns.

Priya Dwivedi¹, A P Konijnenberg¹, S F Pereira¹

¹Optics Research Group, Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, Delft, 2628CJ, Netherlands.

Ultramicroscopy

|June 4, 2018

Summary

This study presents a simple method to precisely correct illumination probe positions in ptychography, a Coherent Diffractive Imaging technique. This advance improves high-resolution image reconstruction quality by achieving sub-pixel accuracy.

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Area of Science:

Optics and Imaging
Materials Science
Physics

Background:

Ptychography, a Coherent Diffractive Imaging technique, utilizes short wavelengths for high-resolution imaging.
Accurate knowledge of illumination probe positions is critical for high-quality ptychographic reconstructions.
Recent research aims to reduce the stringent requirements for probe position accuracy.

Purpose of the Study:

To analyze and demonstrate a straightforward approach for correcting illumination probe positions.
To achieve sub-pixel accuracy in probe position correction for enhanced image reconstruction.
To validate the proposed method using simulations and experimental data.

Main Methods:

Analysis of probe position errors in ptychography.
Development of a straightforward correction algorithm.
Implementation of the correction method with visible light.
Validation through numerical simulations and experimental imaging.

Main Results:

Demonstration of a straightforward method for probe position correction.
Achieved sub-pixel accuracy in correcting illumination probe positions.
Successful validation of the method using visible light experiments and simulations.

Conclusions:

The developed approach offers a simple yet effective way to improve probe position accuracy in ptychography.
This method enhances the quality of high-resolution image reconstructions in Coherent Diffractive Imaging.
The findings are applicable to various short-wavelength imaging techniques, including X-ray and electron microscopy.