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Updated: Feb 9, 2026

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

Published on: April 22, 2013

Electron diffraction and imaging for atom probe tomography.

Rita Kirchhofer¹, David R Diercks¹, Brian P Gorman¹

¹Department of Metallurgical and Materials Engineering, Colorado School of Mines, Golden, Colorado 80401, USA.

The Review of Scientific Instruments

|June 6, 2018

Summary

This summary is machine-generated.

A new electron microscopy system enhances atom probe tomography (APT) data by enabling in situ specimen geometry quantification. This improves data accuracy and enables dynamic electron diffraction experiments for better material analysis.

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$Microcrystal Electron Diffraction of Small Molecules$

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Published on: March 15, 2021

Area of Science:

Materials Science
Analytical Chemistry
Physics

Background:

Accurate quantification of atom probe tomography (APT) specimen geometry is crucial for improving data fidelity.
Electron microscopy is a key technique for pre- and post-experiment characterization.

Purpose of the Study:

To develop an in situ electron microscopy and diffraction system compatible with modern APT hardware.
To enable precise quantification of specimen geometry and dynamic electron diffraction experiments.

Main Methods:

Integrated electron microscopy (secondary/backscattered electron imaging, bright/dark field scanning transmission electron imaging) and diffraction capabilities.
In situ laser pulsed heating for dynamic electron diffraction experiments on APT specimens.

Main Results:

The developed system allows for in situ electron microscopy and diffraction during APT experiments.
The system supports various imaging modes and in situ dynamic diffraction, enhancing APT data accuracy.

Conclusions:

The integrated in situ system significantly improves the fidelity of APT data through precise geometric quantification.
This advancement facilitates dynamic in situ experiments, opening new avenues for materials characterization.