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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Raymond T Co1,2,3, Lawrence J Hall2,3, Keisuke Harigaya2,3
1Leinweber Center for Theoretical Physics, University of Michigan, Ann Arbor, Michigan 48109, USA.
A new mechanism for axion dark matter production via parametric resonance is proposed. This mechanism requires a lower axion decay constant, potentially altering large-scale structure observations.
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