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Traceable Calibration and Demonstration of a Portable Dynamic Force Transfer Standard
Nicholas Vlajic1, Ako Chijioke1
1The National Institute of Standards and Technology, Gaithersburg, MD, USA.
Summary
Researchers developed a new dynamic force transfer standard using an impact hammer for in situ calibration. This method ensures accurate force transducer calibration with low uncertainty, simplifying SI-traceable measurements without specialized voltage equipment.
Area of Science:
- Metrology
- Mechanical Engineering
- Instrumentation
Background:
- Dynamic force transducer calibration is complex due to mechanical system dependencies.
- Existing methods often require specialized equipment and are not performed in situ.
- A need exists for a reliable dynamic force transfer standard for field calibration.
Purpose of the Study:
- To develop and validate a novel dynamic force transfer standard for SI-traceable calibration of force transducers.
- To assess the suitability of a hand-held impact hammer as a transfer standard.
- To demonstrate the application of the transfer standard for calibrating secondary transducers in situ.
Main Methods:
- SI-traceable calibration of an impact hammer using a step function force generated by a suspended mass.
- Evaluation of the transfer standard's dynamic response variance across different users.
- Calibration of a secondary force transducer using the validated transfer standard.
Main Results:
- The impact hammer demonstrated low dynamic response variance, making it a suitable transfer standard.
- The transfer standard achieved a combined standard uncertainty of ≤2.1% (k=2) up to 5 kHz.
- Transfer calibration of a secondary transducer yielded a combined standard uncertainty of <4% (k=2) up to 3 kHz.
Conclusions:
- The developed dynamic force transfer standard enables accurate, in situ calibration of force transducers.
- The impact hammer serves as a practical and reliable transfer standard for SI-traceable measurements.
- This framework simplifies force calibration by eliminating the need for SI-traceable voltage metrology instrumentation.
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