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Cracking effects in squashable and stretchable thin metal films on PDMS for flexible microsystems and electronics

Tiffany Baëtens1, Emiliano Pallecchi1, Vincent Thomy1

  • 1Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN), CNRS, The University of Lille, Cité Scientifique, 59652, Villeneuve d'Ascq, France.

Scientific Reports
|June 24, 2018
PubMed
Summary

Cracking in thin metal films on flexible substrates creates ordered structures and enables self-healing electrical conductivity. This research offers new pathways for high-sensitivity strain gauges and microfabrication without lithography.

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